Optical measurement technics

White light interferometer of different types:
Mireau, Michelson, Linnik.
Confocal microscopy

Actual News


with effect from 1 March 2019

Our new address is:

Breitmeier Messtechnik GmbH

Im Stöck 4 a

76275 Ettlingen

Please note that all our contact details remain the same and all services are continuing to be provided.



Measuring surface parameters is done at Breitmeier Messtechnik GmbH with different technics:

  1. tactile (MiniProfiler)
  2. optic, interferometric (white light interferometer)
  3. optic, scanning





Surface topography measurements

Roughness, flatness, waviness, chatter marks, thickness and surface topography measurements on custom specific workpieces. Single or series measurements with evaluation of the results.

Lead measurement

Measurement of lead structures of sealing surfaces of shafts. Evaluation of the data with protocol (Daimler 2008 specification). Calculation of lead parameters. Standard, micro and nano lead evaluation using stylus and optical methods. Chatter marks measurement and evaluation (BZR parameter).

Surface structure analysis

Roughness measurement on the shop floor

Roughness measurement on the shop floor

It is a problem to measure the surface roughness in-line using conventional measurement devices. These are designed to be used in the measurement room and are therefore not really suited for a rough environment on one hand due to their inherent dirt and vibration sensitivity and on the other hand because they are not very flexible and awkwardly to operate resulting in too long measurement times. Automating the gauge doesn’t really help.